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Leica/Leica EM TXP | Target Preparation Device /Leica EM TXP | Target Preparation Device/1 Ea

TheLeicaEMTXPisatargetpreparationdeviceformilling,sawing,grinding,andpolishingsamplespriortoexaminationbySEM,TEM,andLMtechniques.

AnintegratedstereomicroscopeallowspinpointingandeasypreparationofbarelyvisIBLetargets.

Withthespecimenpivotarmthesamplecanbeobserveddirectlyatananglebetween0°and60°,or90°tothefrontfacefordistancedeterminationwithaneyepiecegraticule.

Integratedautomaticprocesscontrol

IntegratedprocesscontrolwithautomaticE-Wguidingmechanism,force-regulatedfeedcontrolandcountdownfunctionsavestheuserfromtime-consumingroutinesamplepreparation.

Surfacefinishandtargetexamination

Surfacefinishandtargetexaminationwiththeintegratedstereomicroscopemeansthattheuserdoesnothavetotransferthesamplefordistanceestimationandsurfaceevaluation,whichincreasesuserefficiency.

Variety of tool inserts

Varietyoftoolinserts

Varietyoftoolinsertsallowsthespecimentobemilled,sawed,drilled,groundandpolishedwithoutsampleremovalfromtheinstrument.TheABIlitytoobservetheprocessthroughthestereomicroscoperesultsintimeandcostsavings.

Inspection of Multilayer Samples

InspectionofMultilayerSamples

WorkflowinQualityControl:CombiningthetargetsurfacingsystemLeicaEMTXPandthelightmicroscopeLeicaDM2700Mallowstoreducetherequiredprocedure,streamlinetheworkflowandproducereliableandpreciseresults.

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