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H. Tong, L.T. Nguyen (1990) 368 pp.
Various industries and universities have aimed their activities toward the development of highly sensitive techniques capable of studying ultrathin Polymers films. Provides researchers with a working description of the principles of operation, areas of application and data analysis methods for some of the newly developed techniques, as well as sufficient references for future in-depth studies of thin Polymers films. The techniques covered are divided into two groups–bulk property measurements and surface/interface property measurements–with chapters covering microdielectrometry, stress measurements by x-ray diffraction, laser interferometry, ion beam analysis, photothermal analysis, and XPS/SIMS/AES, among other techniques. Abstracts for each of the chapters are conveniently located in the preface.