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nanoandmore/PPP-RT-NCHR/PPP-RT-NCHR-10/Box of 10 AFM Probes

Cantilever:

F:330kHz
C:42N/m
L:125µm

Applications:

Non-Contact/StandardTappingModeAFMProbes

Description:

ThenewPointProbe®Plus(PPP)combinesthewell-knownfeaturesoftheprovenPointProbe®seriessuchashighapplicationversatilityandcompatibilitywithmostcommercialSPMswithafurtherreducedandmorereproducIBLetiprADIusaswellasamoredefinedtipshape.Theexcellenttipradiusandtheminimizedvariationintipshapeprovidemorereproducibleimagesandenhancedresolution.

NANOSENSORS™PPP-RT-NCHRprobesaredesignedfornon-contactmodeortappingmodeAFM(alsoknownas:attractiveordynamicmode).ThisAFMprobecombineshighoperationstABIlitywithoutstandingsensitivityandfastscanningability.

ForcertainapplicationstherotatedPointProbe® PlusTipoffersmoresymmetricimaging.Therotatedtipshapeisidenticaltotheclassictipshapebutitisrotatedby180°degreeswithrespecttothecantileverbeamdirection.

Theprobeoffersuniquefeatures:

  • excellenttipradiusofcurvature
  • highlydopedsilicontodissipatestaticcharge
  • highmechanicalQ-factorforhighsensitivity
Thereflexcoatingisanapproximately30nmthickaluminumcoatingonthedetectorsideofthecantileverwhichenhancesthereflectivityofthelaserbeambyafactorofabout2.5.FurThermoreitpreventslightfrominterferingwithinthecantilever.Thevirtuallystress-freecoatingisbendingthecantileverlessthan2%ofthecantileverlength.

AFMTip:

  • AFMCantilever:

  • Beam
  • 125µm(115-135µm)*
  • 30µm(22.5-37.5µm)*
  • 4µm(3-5µm)*
  • 42N/m(10-130N/m)*
  • 330kHz(204-497kHz)*
  • *guaranteedrangeThisproductfeaturesalignmentgroovesonthebacksideoftheholderchip.
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