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nanoandmore/DDESP/DDESP-50/Box of 50 AFM Probes

Cantilever:

F:400kHz
C:80N/m
L:125µm

Applications:

ConductiveAFMProbes
DiamondAFMProbes

Description:

NanoWorldPointprobe®NCHprobesaredesignedfornon-contactortapping™modeimaging.ThisprobetypecombineshighoperationstABIlitywithoutstandingsensitivityandfastscanningability.

AllSPMandAFMprobesofthePointprobe®seriesaremadefrommonolithicsiliconwhichishighlydopedtodissipatestaticcharge.TheyarechemicallyinertandofferahighmechanicalQ-factorforhighsensitivity.Thetipisshapedlikeapolygonbasedpyramid.

Forapplicationsthatrequirehardcontactbetweentipandsamplethisprobeoffersarealdiamondtip-sidecoating.Thiscoatingfeaturesextremelyhighwearresistanceduetotheunsurpassedhardnessofdiamond.ThetypicalmacroscopictiprADIusofcurvatureliesintherangebetween100and200nm.Nanoroughnessesinthe10nmregimeimprovetheresolutiononflatsurfaces.

TheCDTfeaturesaconductivediamondcoating.SometypicalapplicationsforthistipareScanningSpreadingResistanceMicroscopy(SSRM),TunnelingAFM(ConductingAFM)andScanningCapacitanceMicroscopy(SCM).

ThisprobewassoldbyVeecoInstrumentsInc.forover10yearsupuntilApril2007.BrukerCorporation,whichacquiredVeecometrologybusiness,isnolongersellingtheoriginalprobewhichhasalwaysbeenmanufacturedbyNanoWorld®.

ConductiveDiamondCoating/AluminumReflexCoating

Theconductivediamondcoatingconsistsofa100nmthickpolycrystallinediamondlayerdepositedonthetipsideofthecantileverresultinginanunsurpassedhardnessofthetip.Thecoatingishighlydopedwithboronwhichleadstoamacroscopicresistivityof0.003-0.005Ohm•cm.

Thealuminumreflexcoatingdepositedonthedetectorsideofthecantileverenhancesthereflectanceofthelaserbeamandpreventslightfrominterferingwithinthecantilever.

AFMTip:

  • AFMCantilever:

  • Beam
  • 125µm(120-130µm)*
  • 30µm(25-35µm)*
  • 4µm(3.5-4.5µm)*
  • 80N/m(42-142N/m)*
  • 400kHz(280-510kHz)*
  • *typicalrangeThisproductfeaturesalignmentgroovesonthebacksideoftheholderchip.
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