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nanoandmore/ARROW-CONTPt/ARROW-CONTPt-W/Box of 385 AFM Probes

Cantilever:

F:14kHz
C:0.2N/m
L:450µm

Applications:

ConductiveAFMProbes

Description:

Optimizedpositioningthroughmaximizedtipvisibility

NanoWorldArrow™CONTPtAFMprobesaredesignedforContactModeimaging.FurThermorethistypecanbeusedforForceDistanceSpectroscopyModeorPulsedForceMode(PFM).TheCONTtypeisoptimizedforhighsensitivityduetoalowForceConstant.

AllAFMprobesoftheArrow™seriesaremadefrommonolithicsiliconwhichishighlydopedtodissipatestaticcharge.TheyarechemicallyinertandofferahighmechanicalQ-factorforhighsensitivity.Theseprobesfeaturearectangularcantileverwithatriangularfreeendandatetrahedraltip.

Additionally,thisprobeoffersanexcellenttiprADIusofcurvature.

TheuniqueArrow™shapewiththetippositionattheveryendofthecantileverallowseasypositioningofthetipontheareaofinterest.

PtIr5Coating

ThePtIr5coatingconsistsofa23nmthickplatinumiridium5layerdepositedonbothsidesofthecantilever.Thetipsidecoatingenhancestheconductivityofthetipandallowselectricalcontacts.Thedetectorsidecoatingenhancesthereflectanceofthelaserbeambyafactorof2andpreventslightfrominterferingwithinthecantilever.

Thecoatingprocessisoptimizedforstresscompensationandwearresistance.Wearatthetipcanoccurifoperatingincontact-,friction-orforcemodulationmode.Asthecoatingisalmoststress-freethebendingofthecantileverduetostressislessthan2degrees.

AFMTip:

  • AFMCantilever:

  • Beam
  • 450µm(445-455µm)*
  • 45µm(40-50µm)*
  • 2µm(1.5-2.5µm)*
  • 0.2N/m(0.06-0.38N/m)*
  • 14kHz(10-19kHz)*
  • *typicalrange
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