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nanoandmore/HQ:XSC11/Hard/Al BS/HQ:XSC11/Hard/Al BS15/Box of 15 AFM Probes

Applications:

Hardened / Enhanced Wear Resistance AFM Probes
Nanoindentation and Lithography AFM Probes
Hardened / Enhanced Wear Resistance Tapping AFM Probes

Description:

Probes of the 11 series have four different cantilevers, two on each side of the holder chip. They can be used in various applications.

A wear-resistant coating with thickness 20 nm is applied to the tipside of the cantilever. The coating is chemically inert and more hydrophobic than Si with natural oxide layer.
Wear-resistant coating with thickness 20 nm on the tipside of the cantilever. Al coating with thickness 30nm on the backside of the cantilever.

AFM Tip:

  • Rotated
  • 15 µm (12 - 18 µm)*
  • < 20="" nm="">
  • 40°

    • AFM Cantilevers:

    Cantilever A
  • Beam
  • 500 µm
  • 30 µm
  • 2.7 µm
  • 0.2 N/m (0.1 - 0.4 N/m)*
  • 15 kHz (12 - 18 kHz)*
    • Cantilever B
  • Beam
  • 210 µm
  • 30 µm
  • 2.7 µm
  • 2.7 N/m (1.1 - 5.6 N/m)*
  • 80 kHz (60 - 100 kHz)*
    • Cantilever C
  • 150 µm
  • 30 µm
  • 2.7 µm
  • 7 N/m (3 - 16 N/m)*
  • 155 kHz (115 - 200 kHz)*
    • Cantilever D
  • Beam
  • 100 µm
  • 50 µm
  • 2.7 µm
  • 42 N/m (17 - 90 N/m)*
  • 350 kHz (250 - 465 kHz)*
    • * typical range

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