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nanoandmore/AR5-NCLR/AR5-NCLR-10/Box of 10 AFM Probes

Cantilever:

F:190kHz
C:48N/m
L:225µm

Applications:

HighAspectRatio(HAR)AFMProbes

Description:

NANOSENSORS™AR5-NCLRAFMtipsaredesignedfornon-contactortappingmodeAFM.TheNCLprobeisdesignedforSPMsystemsrequiringaminimumcantileverlength>125µmoraresonancefrequencyoflessthan400kHz.Comparedtothehighfrequencynon-contacttypeNCHthemaximumscanningspeedisslightlyreduced.ThiscantilevertypecombineshighoperationstABIlitywithoutstandingsensitivityandfastscanningability.

Formeasurementsonsampleswithsidewallanglesapproaching90°NANOSENSORS™producesspeciallytailoredtips.ThesetipsareFIB(FocusedIonBeam)milledtoachieveahighaspectratioportionbetterthan5:1attheendofthecommonsilicontip.Thissubtractivemethodofproducingthehighaspectrationeedleofferstheadvantageofhighlateralstiffnessandrigidityofthetip.

Theprobeoffersuniquefeatures:

  • lengthofthehighaspectratioportionofthetip>2µm
  • typicalaspectratioat2µmintheorderof7:1(whenviewedfromsideaswellasalongcantileveraxis)
  • excellenttiprADIusofcurvature
  • highlydopedsilicontodissipatestaticcharge
  • highmechanicalQ-factorforhighsensitivity
  • precisealignmentofthecantileverposition(within+/-2µm)whenusedwiththeAlignmentChip
  • compatIBLewithPointProbe®PlusXY-AlignmentSeries
Aluminiumreflexcoatingondetectorsideofthecantilever

AFMTip:

  • AFMCantilever:

  • Beam
  • 225µm(215-235µm)*
  • 38µm(30-45µm)*
  • 7µm(6-8µm)*
  • 48N/m(21-98N/m)*
  • 190kHz(146-236kHz)*
  • *guaranteedrangeThisproductfeaturesalignmentgroovesonthebacksideoftheholderchip.
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