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nanoandmore/SSS-MFMR/SSS-MFMR-20/Box of 20 AFM Probes

Cantilever:

F:75kHz
C:2.8N/m
L:225µm

Applications:

MagneticAFMProbes

Description:

TheNANOSENSORS™SSS-MFMRAFMprobeisoptimizedforhighresolutionmagneticforceimaging.TheSuperSharpSilicon™tipbasiscombinedwithaverythinhardmagneticcoatingresultinanextremelysmallrADIusofthecoatedtipandahighaspectratioatthelastfewhundrednanometersofthetip-theessentialdemandsforhighlateralresolutiondownto20nminambientconditions.

DuetothelowmagneticmomentofthetipthesensitivitytomagneticforcesissignificantlydecreasedifcomparedtostandardMFMprobesbutthedisturbanceofsoftmagneticsamplesisalsoreduced.
 
TheSPMprobeoffersuniquefeatures:

  • hardmagneticcoatingonthetipside(coercivityofapp.125Oe,remanencemagnetizationofapp.80emu/cm3)
  • effectivemagneticmoment0.25xofstandardprobes
  • metallicelectricalconductivity
  • excellenttipradiusofcurvature
  • magneticresolutionbetterthan25nm
  • Alcoatingondetectorsideofcantileverenhancingthereflectivityofthelaserbeambyafactorofabout2.5
  • precisealignmentofthecantileverposition(within+/-2µm)whenusedwiththeAlignmentChip
  • compatIBLewithPointProbe®PlusXY-AlignmentSeries


Asbothcoatingsarealmoststress-freethebendingofthecantileverduetostressislessthan3.5%ofthecantileverlength.Forenhancedsignalstrengththemagnetizationofthetipbymeansofastrongpermanentmagnetpriortothemeasurementisrecommended.

Thehardmagneticcoatingonthetipischaracterizedbyacoercivityofapp.125Oeandaremanencemagnetizationofapp.80emu/cm3(thesevaluesweredeterminedonaflatsurface).

AFMTip:

  • AFMCantilever:

  • Beam
  • 225µm(215-235µm)*
  • 28µm(20-35µm)*
  • 3µm(2-4µm)*
  • 2.8N/m(0.5-9.5N/m)*
  • 75kHz(45-115kHz)*
  • *guaranteedrangeThisproductfeaturesalignmentgroovesonthebacksideoftheholderchip.
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