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nanoandmore/ATEC-EFM/ATEC-EFM-50/Box of 50 AFM Probes

Cantilever:

F:85kHz
C:2.8N/m
L:240µm

Applications:

ConductiveAFMProbes

Description:

NANOSENSORSAdvancedTEC™EFMAFMtipsaredesignedforforcemodulationmodeimaging.Theyfeatureatetrahedraltipthatprotrudesfromtheveryendofthecantilever.

ThisuniquefeatureallowsprecisepositioningandmakestheAdvancedTEC™theonlyAFMscanningprobeintheworldthatoffersREALTIPVISIBILITYFROMTOP,evenwhentheprobeistiltedduetoitsmountingontotheAFMhead.Thisfeaturemakesthemthepremiumchoiceforallapplicationswherethetiphastobeplacedexactlyonthepointofinterestand/orhastobevisIBLe(e.g.Nanomanipulation).

DuetotheirverysmallhalfconeanglesthetipsoftheAdvancedTEC™Seriesshowgreatperformanceonsamplesthathaveasmallpatternsizecombinedwithsteepsamplefeatures.

Theprobeoffersuniquefeatures:
  • REALTIPVISIBILITYFROMTOP
  • metallicconductivityofthetip
  • highmechanicalQ-factorforhighsensitivity
  • aspectratioofthelast1.5µmofthetip>4:1(fromfrontandside)
  • tipshapeisdefinedbyrealcrystalplanesresultinginhighlyreproduciblegeometriesandextremelysmoothsurfaces
  • highlydopedsinglecrystalsilicon(0.01-0.025Ohm*cm)
  • rectangularcantileverwithtrapezoidalcrosssection
  • holderdimensionsare1.6mmx3.4mm

Pleasenote:
Wearatthetipcanoccurifoperatingincontact-,friction-orforcemodulationmodeorwhereitisnecessarytoconducthighcurrents.
ThePtIr5coatingisanapproximately25nmthickdoublelayerofchromiumandplatinumiridium5onbothsidesofthecantilever.Thetipsidecoatingenhancestheconductivityofthetipandallowselectricalcontacts.Thedetectorsidecoatingenhancesthereflectivityofthelaserbeambyafactorofabout2andpreventslightfrominterferingwithinthecantilever.Thecoatingprocessisoptimizedforstresscompensationandwearresistance.Thebendingofthecantileverduetostressislessthan3.5%ofthecantileverlength.

AFMTip:

  • AFMCantilever:

  • Beam
  • 240µm(230-250µm)*
  • 35µm(30-40µm)*
  • 3µm(2-4µm)*
  • 2.8N/m(0.7-9N/m)*
  • 85kHz(50-130kHz)*
  • *guaranteedrange
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