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nanoandmore/SSS-FMR/SSS-FMR-50/Box of 50 AFM Probes

Cantilever:

F:75kHz
C:2.8N/m
L:225µm

Applications:

SupersharpAFMProbes
SupersharpTappingModeAFMProbes

Description:

NANOSENSORSSSS-FMRAFMprobesaredesignedforforcemodulationmode.

ForenhancedresolutionofnanostructuresandmicroroughnessweofferourSuperSharpSilicon™tipwithunrivalledsharpness.

TheFMtypeisofferedforforcemodulationmicroscopy.TheforceconstantofthisAFMprobespansthegapbetweencontactandnon-contactmodeandisspeciallytailoredfortheforcemodulationmode.TheSSS-FMRtipservesalsoasabasisforhighresolutiontipswithmagneticcoatingSSS-MFMR.FurThermorenon-contactortappingmodeoperationispossIBLewiththeFMtipbutwithreducedoperationstABIlity.

Theprobeoffersuniquefeatures:

  • excellenttiprADIusofcurvature
  • typicalaspectratioat200nmfromtipapexintheorderof4:1
  • monolithicmaterial
  • highlydopedsilicontodissipatestaticcharge
  • chemicallyinert
  • highmechanicalQ-factorforhighsensitivity
Thereflexcoatingisanapproximately30nmthickaluminumcoatingonthedetectorsideofthecantileverwhichenhancesthereflectivityofthelaserbeambyafactorofabout2.5.Furthermoreitpreventslightfrominterferingwithinthecantilever.Thevirtuallystress-freecoatingisbendingthecantileverlessthan3.5%ofthecantileverlength.

AFMTip:

  • AFMCantilever:

  • Beam
  • 225µm(215-235µm)*
  • 30µm(20-35µm)*
  • 3µm(2-4µm)*
  • 2.8N/m(0.5-9.5N/m)*
  • 75kHz(45-115kHz)*
  • *guaranteedrangeThisproductfeaturesalignmentgroovesonthebacksideoftheholderchip.
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