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nanoandmore/NWCDTNCHR/NWCDTNCHR50/Box of 50 AFM Probes

Cantilever:

F: 400 kHz
C: 80 N/m
L: 125 µm

Applications:

Conductive AFM Probes
Diamond AFM Probes

Description:

NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping™ mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

All probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

For applications that require hard contact between tip and sample this probe offers a real diamond tip-side coating. This coating features extremely high wear resistance due to the unsurpassed hardness of diamond.

The typical macroscopic tip radius of curvature lies in the range between 100 and 200 nm. Nanoroughnesses in the 10 nm regime improve the resolution on flat surfaces.

The CDT features a conductive diamond coating. Some typical applications for this tip are Tunneling AFM (Conducting AFM) and Scanning Capacitance Microscopy (SCM).

Conductive Diamond Coating / Aluminum Reflex Coating

The conductive diamond coating consists of a 100 nm thick polycrystalline diamond layer deposited on the tip side of the cantilever resulting in an unsurpassed hardness of the tip. The coating is highly doped with boron which leads to a macroscopic resistivity of 0.003 - 0.005 Ohm•cm.

The aluminum reflex coating deposited on the detector side of the cantilever enhances the reflectance of the laser beam and prevents light from interfering within the cantilever.

AFM Tip:

    • AFM Cantilever:

  • Beam
  • 125 µm (120 - 130 µm)*
  • 30 µm (25 - 35 µm)*
  • 4 µm (3.5 - 4.5 µm)*
  • 80 N/m (42 - 142 N/m)*
  • 400 kHz (280 - 510 kHz)*
    • * typical range This product features alignment grooves on the back side of the holder chip.

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